Title :
Amplitude-sensitive interferometric ellipsometer on TN-LCD optical parameters measurement
Author :
Wei, H.C. ; Tsai, C.C. ; Chou, C.
Author_Institution :
Nat. Yang Ming Univ., Taipei
Abstract :
This research proposes an amplitude-sensitive heterodyne interferometric ellipsometer to determine TN-LC cell parameters precisely based on single wavelength at normal incidence. The advantage is the capability of two dimensional distribution measurement using CCD camera.
Keywords :
ellipsometry; light interferometry; CCD camera; amplitude-sensitive interferometric ellipsometer; heterodyne interferometric ellipsometer; optical parameters measurement; two dimensional distribution measurement; Ellipsometry; Frequency; Laser beams; Liquid crystals; Optical interferometry; Optical mixing; Optical polarization; Optical variables control; Phase detection; Wavelength measurement;
Conference_Titel :
Optical Fiber Communication and Optoelectronics Conference, 2007 Asia
Conference_Location :
Shanghai
Print_ISBN :
978-0-9789217-2-9
Electronic_ISBN :
978-0-9789217-2-9
DOI :
10.1109/AOE.2007.4410696
