DocumentCode
2490519
Title
Deformable registration of histological sections to brain MR images using a hybrid boundary-based slice-to-volume approach
Author
Osechinskiy, Sergey ; Kruggel, Frithjof
Author_Institution
Dept. of Biomed. Eng., Univ. of California, Irvine, CA, USA
fYear
2011
fDate
Aug. 30 2011-Sept. 3 2011
Firstpage
4876
Lastpage
4879
Abstract
Registration of histology to three-dimensional (3D) magnetic resonance (MR) images is often required for the analysis of brain structure and investigation of brain pathologies. A novel algorithm for deformable registration of an individual histological section to a brain MR image is described. The cost function uses a novel hybrid intensity- and boundary surface-based measure that reflects the contrast of histological slice intensities across the boundary of the pial and inner cortical surface. The algorithm relies on implicit representation of cortical surfaces reconstructed from an anatomical MR image, and computes the cost function in a level set framework. The algorithm is evaluated on cross-modality registration of myelin-stained histological sections to a high-resolution MR image of the human brain.
Keywords
biomedical MRI; brain; image reconstruction; image registration; image representation; image resolution; medical image processing; surface reconstruction; 3D magnetic resonance images; brain MR image; brain pathology; brain structure; cortical surface reconstruction; cross-modality registration; deformable registration; high-resolution MR image; histological slice intensity; human brain; hybrid boundary-based slice-to-volume approach; image representation; level set framework; myelin-stained histological section; pial cortical surface; Cost function; Image reconstruction; Level set; Magnetic resonance imaging; Spline; Surface reconstruction; Three dimensional displays; Brain; Humans; Magnetic Resonance Imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location
Boston, MA
ISSN
1557-170X
Print_ISBN
978-1-4244-4121-1
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2011.6091208
Filename
6091208
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