Title :
In-vitro cell quantification method based on depth dependent analysis of brain tissue microscopic images
Author :
Sami, Mustafa M. ; Tamura, Yasuhisa ; Yilong, Cui ; Kikuchi, Hisakazu ; Kataoka, Yosky
Author_Institution :
Cellular Function Imaging Lab., RIKEN, Kobe, Japan
fDate :
Aug. 30 2011-Sept. 3 2011
Abstract :
In this study we developed a new automatic quantification method to count the number of targeted fluorescently labeled molecules of in-vitro rat brain tissue images. NG2+ glial cells were monitored in order to detect their proliferation to their same kind of cells or to another astrocyte cells using different fluorescently labeled molecules. The method is based on morphological segmentation followed by depth-dependent detection operation applied to a stack of confocal microscopic images. The number of local maxima peak points was used to count the number of the labeled cells. The method shows good promise for the computer-aided assessment in neurological studies for accurate automatic counting systems.
Keywords :
biomedical optical imaging; brain; cellular biophysics; image segmentation; medical image processing; molecular biophysics; neurophysiology; optical microscopy; NG2+ glial cells; astrocyte cells; automatic counting system; automatic quantification; brain tissue microscopic images; cell proliferation; cell quantification; computer aided assessment; confocal microscopic images; depth dependent analysis; depth dependent detection; fluorescently labeled molecules; morphological segmentation; neurological study; rat brain tissue image; Brain; Fluorescence; Image color analysis; Image segmentation; Manuals; Microscopy; Animals; Cell Count; Cell Line; Cell Proliferation; Cell Tracking; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Male; Microscopy, Confocal; Neuroglia; Pattern Recognition, Automated; Rats; Rats, Wistar; Reproducibility of Results; Sensitivity and Specificity; Subtraction Technique;
Conference_Titel :
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-4121-1
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2011.6091217