Analysis of subsurface scattering under generic illumination

We present a new method of analyzing subsurface scattering occurring in a translucent object from a single image taken under generic illumination. In our method, diffuse subsurface reflectance in the subsurface scattering model can be linearly solved by quantizing the distances between each pair of surface points. Then, the dipole approximation is fit to the diffuse subsurface reflectance. By applying our method to real images, we confirm that the parameters of subsurface scattering can be computed for different materials.