Thermal Mapping of Power Devices with a Completely Automated Thermoreflectance Measurement System

Author

Rossi, L. ; Breglio, G. ; Irace, A. ; Spirito, P.

Author_Institution

Dipt. di Ingegneria Elettronica e delle Telecomunicazioni, Univ. degli Studi Napoli "Federico II"

fYear

0

fDate

0-0 0

Firstpage

41

Lastpage

44

Abstract

Aim of this paper is to present a system for a completely automated thermal mapping acquisition on the surface of power ICs and devices. This system is based on a single point sensor which measures the variation of the reflection coefficient due to a temperature change in metals and semiconductors. The main features of such sensor are the improved spatial resolution and bandwidth with respect to the classical infrared acquisition systems

Keywords

power integrated circuits; power semiconductor devices; temperature measurement; thermoreflectance; infrared acquisition systems; power devices; power integrated circuit; reflection coefficient; single point sensor; thermal mapping acquisition; thermoreflectance measurement system; Bandwidth; Infrared sensors; Power integrated circuits; Power measurement; Reflection; Sensor phenomena and characterization; Sensor systems; Spatial resolution; Temperature sensors; Thermoreflectance;

fLanguage

English

Publisher

ieee

Conference_Titel

Research in Microelectronics and Electronics 2006, Ph. D.

Conference_Location

Otranto

Print_ISBN

1-4244-0157-7

Type

conf

DOI

10.1109/RME.2006.1689891

Filename

1689891