Title :
Analysis of the Substrate Noise Effects due to DC-DC Converter Integration
Author :
Vinella, Rosa Maria ; Antonicelli, Roberto
Author_Institution :
Dipt. di Elettrotecnica ed Eletronica, Politecnico di Bari
Abstract :
Substrate noise mechanisms caused by the integration of a DC-DC converter into a 0.13 mum CMOS technology integrated circuit are investigated in order to provide designers with guidelines to improve sensitive analog/RF circuits isolation. In particular, the effects of the DRIFTMOS technological process and the dependence of substrate noise coupling on physical separation distance, floorplanning and introduction of guarding structures are fully described
Keywords :
CMOS analogue integrated circuits; DC-DC power convertors; PWM power convertors; integrated circuit noise; 0.13 micron; CMOS technology; DC-DC converter integration; DRIFTMOS technological process; RF circuit isolation; analog circuit isolation; substrate noise coupling; substrate noise effects; substrate noise mechanisms; Analog integrated circuits; CMOS analog integrated circuits; CMOS integrated circuits; CMOS technology; DC-DC power converters; Guidelines; Integrated circuit noise; Integrated circuit technology; Isolation technology; Radiofrequency integrated circuits;
Conference_Titel :
Research in Microelectronics and Electronics 2006, Ph. D.
Conference_Location :
Otranto
Print_ISBN :
1-4244-0157-7
DOI :
10.1109/RME.2006.1689893
