• DocumentCode
    2491905
  • Title

    A landmark-free framework for the detection and description of shape differences in embryos

  • Author

    Rolfe, S.M. ; Shapiro, L.G. ; Cox, T.C. ; Maga, A.M. ; Cox, L.L.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Washington, Seattle, WA, USA
  • fYear
    2011
  • fDate
    Aug. 30 2011-Sept. 3 2011
  • Firstpage
    5153
  • Lastpage
    5156
  • Abstract
    This paper introduces a new method to quantify and characterize shape changes during early facial development without the use of landmarks. Landmarks are traditionally used in morphometric analysis, but very few can be identified reliably across all stages of embryonic development. This method uses deformable registration to produce a dense vector field describing the point correspondences between two images. Low and mid-level features are extracted from the deformable vector field to find regions of organized differences that are biologically relevant. These methods are shown to detect regions of difference when evaluated on chick embryo images warped with small magnitude deformations in regions critical to midfacial development.
  • Keywords
    biomedical optical imaging; image registration; medical image processing; optical tomography; spatial variables measurement; deformable registration; early facial development; embryo shape difference description; embryo shape difference detection; embryonic development; landmark free framework; morphometric analysis; vector field; Embryo; Entropy; Feature extraction; Morphology; Shape; Transforms; Vectors; Algorithms; Anatomic Landmarks; Animals; Artificial Intelligence; Chick Embryo; Face; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Tomography, Optical;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
  • Conference_Location
    Boston, MA
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-4121-1
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2011.6091276
  • Filename
    6091276