DocumentCode :
2492072
Title :
Endurance test circuit for power capacitors
Author :
Picci, Guido ; Poletti, Franco
Author_Institution :
ICAR SpA, Monza, Italy
fYear :
1998
fDate :
22-25 Jun 1998
Firstpage :
251
Lastpage :
254
Abstract :
Power capacitors used in high-power circuits like GTO turn-off snubbers need severe endurance tests to ensure their reliability in today´s very demanding applications. A special test circuit has been developed and built in order to apply to the capacitors the voltage and current waveforms that are required to reproduce its real operating conditions. It consists essentially of a full bridge circuit, made by many IGBT modules in series/parallel connection: the capacitor under test is connected to the AC side, through a series inductor, and a DC power supply is connected to the DC side of the bridge. Each of the four IGBT switches that form the bridge is divided into two blocks that can be series or parallel connected, in order to accommodate a broad range of operating voltage and current for the capacitor under test
Keywords :
insulated gate bipolar transistors; power bipolar transistors; power capacitors; power semiconductor switches; reliability; snubbers; 10 kA; 10 kHz; 10 mus; 2 kV; 4 kV; 5 kA; DC power supply; GTO turn-off snubbers; IGBT switches; current waveforms; full bridge circuit; high-power circuits; operating conditions; power capacitor endurance test circuit; reliability; series inductor; series/parallel connection; voltage waveforms; Bridge circuits; Circuit testing; Inductors; Insulated gate bipolar transistors; Power capacitors; Power supplies; Snubbers; Switched capacitor circuits; Switches; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Modulator Symposium, 1998. Conference Record of the 1998 Twenty-Third International
Conference_Location :
Rancho Mirage, CA
ISSN :
1076-8467
Print_ISBN :
0-7803-4244-5
Type :
conf
DOI :
10.1109/MODSYM.1998.741239
Filename :
741239
Link To Document :
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