Title :
1999 GaAs Reliability Workshop. Proceedings (Cat. No.00TH8459)
Abstract :
The following topics were dealt with: gallium arsenide devices; reliability testing; device biasing; life testing
Keywords :
III-V semiconductors; gallium arsenide; semiconductor device reliability; GaAs; gallium arsenide; reliability;
Conference_Titel :
GaAs Reliability Workshop, 1999. Proceedings
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7908-0100-0
DOI :
10.1109/GAASRW.1999.874079
