Title :
Study of multiple layer dielectric loaded elliptical ridge waveguide by edge finite element method
Author :
Li, Guojian ; Ma, Aning ; Cheng, Yinqin
Author_Institution :
Sch. of Electr. Eng., Northwest Univ. for Nat., Lanzhou, China
Abstract :
A new kind of multiple layer dielectric loaded elliptical ridge waveguide is presented in this paper. Variations of the cutoff wavelength and single-mode bandwidth with the ridge dimensions for different values of dielectric constant have been investigated in detail by using edge element method. The field patterns of the waveguide also have been presented. The results will be of practical significance in designing ridge waveguide components in microwave and millimeter wave engineering.
Keywords :
dielectric-loaded waveguides; finite element analysis; permittivity; ridge waveguides; cutoff wavelength; dielectric constant; edge finite element method; field patterns; microwave engineering; millimeter wave engineering; multiple layer dielectric loaded elliptical ridge waveguide; ridge dimensions; ridge waveguide component design; single-mode bandwidth; Bandwidth; Dielectrics; Finite element methods; Loaded waveguides; Optical waveguides; Rectangular waveguides;
Conference_Titel :
Microwave and Millimeter Wave Technology (ICMMT), 2012 International Conference on
Conference_Location :
Shenzhen
Print_ISBN :
978-1-4673-2184-6
DOI :
10.1109/ICMMT.2012.6230133
