• DocumentCode
    2492402
  • Title

    Comparison of 4H-SiC Separate Absorption and Multiplication Region Avalanche Photodiodes Structures for UV Detection

  • Author

    Cha, Ho-Young ; Soloviev, Stanislav ; Dunne, Greg ; Rowland, Larry ; Zelakiewicz, Scott ; Waldrab, P. ; Sandvik, Peter

  • Author_Institution
    GE Global Res., Niskayuna
  • fYear
    2006
  • fDate
    22-25 Oct. 2006
  • Firstpage
    14
  • Lastpage
    17
  • Abstract
    We designed and fabricated silicon carbide (SiC) separate absorption multiplication region avalanche photodiodes (SAM-APDs) for UV detection in harsh environment applications. Two variations of device types were compared. Type I was designed to achieve reach-through (i.e. multiplication, charge, and absorption layers are depleted) prior to reaching high gain while Type II was designed not to achieve reach-through (i.e. only the multiplication region is depleted). It was found that both the dark current behavior and the responsivity were improved significantly by employing a nonreach-through design. According to preliminary measurements, the maximum quantum efficiency of the type II was ~70 % at the wavelength of 300 nm.
  • Keywords
    avalanche photodiodes; silicon compounds; ultraviolet detectors; wide band gap semiconductors; 4H-SiC; SiC; UV detection; avalanche photodiodes; dark current behavior; harsh environment; maximum quantum efficiency; nonreach-through design; responsivity; separate absorption multiplication region; silicon carbide; wavelength 300 nm; wide bandgap semiconductor; Anodes; Avalanche photodiodes; Cathodes; Dark current; Electromagnetic wave absorption; Ionization; Plasma applications; Silicon carbide; Stability; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2006. 5th IEEE Conference on
  • Conference_Location
    Daegu
  • ISSN
    1930-0395
  • Print_ISBN
    1-4244-0375-8
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2007.355706
  • Filename
    4178544