DocumentCode :
2492556
Title :
Recording And Erasing Characteristics At A Wavelength Of 680nm For A Phase Change Disk Designed For 830nm Wavelength
Author :
Inoue, K. ; Ohta, T. ; Ishida, T. ; Gotoh, Y. ; Satoh, I.
Author_Institution :
Matsushita Electric Industrial Co., Ltd.
fYear :
1993
fDate :
5-9 July 1993
Firstpage :
122
Lastpage :
123
Keywords :
Dielectric substrates; Disk recording; Frequency; Laboratories; Laser noise; Laser transitions; Optical recording; Power lasers; Pulsed laser deposition; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optical Memory and Optical Data Storage, 1993, Conference Digest., Joint International Symposium on
Conference_Location :
Maui, HI, USA
Print_ISBN :
0-7803-1286-4
Type :
conf
DOI :
10.1109/OMODS.1993.696751
Filename :
696751
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2492556
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