Title :
Image observation of pico second electrical pulse by scanning force optoelectronic microscope
Author :
Takeuchi, K. ; Mizuhara, A.
Author_Institution :
Teratec Corp., Musashino, Japan
Abstract :
We succeeded for the first time in visualizing instantaneous voltage distribution of 2ps electrical pulse propagating on coplanar strips (CPS). This result was obtained using a scanning force optoelectronic microscope (SFOEM) which we have developed by coupling a scanning force microscope (SFM) and an ultrafast optical sampling technique. The observed voltage distribution shows a single peak deviating outward. The result seems not consistent with a simple theoretical prediction. There is a possibility that simple theoretical treatments usually used are no more useful for calculating ultrafast pulse distribution.
Keywords :
atomic force microscopy; high-speed optical techniques; optical microscopy; optoelectronic devices; voltage distribution; voltage measurement; coplanar strip; picosecond electrical pulse; scanning force microscope; scanning force optoelectronic microscope; ultrafast optical sampling; voltage distribution imaging; Laser mode locking; Optical microscopy; Optical pulse generation; Optical pulses; Probes; Sampling methods; Strips; Switches; Ultrafast optics; Voltage;
Conference_Titel :
Microwave Symposium Digest, 1997., IEEE MTT-S International
Conference_Location :
Denver, CO, USA
Print_ISBN :
0-7803-3814-6
DOI :
10.1109/MWSYM.1997.596700