• DocumentCode
    2492597
  • Title

    Image observation of pico second electrical pulse by scanning force optoelectronic microscope

  • Author

    Takeuchi, K. ; Mizuhara, A.

  • Author_Institution
    Teratec Corp., Musashino, Japan
  • Volume
    3
  • fYear
    1997
  • fDate
    8-13 June 1997
  • Firstpage
    1643
  • Abstract
    We succeeded for the first time in visualizing instantaneous voltage distribution of 2ps electrical pulse propagating on coplanar strips (CPS). This result was obtained using a scanning force optoelectronic microscope (SFOEM) which we have developed by coupling a scanning force microscope (SFM) and an ultrafast optical sampling technique. The observed voltage distribution shows a single peak deviating outward. The result seems not consistent with a simple theoretical prediction. There is a possibility that simple theoretical treatments usually used are no more useful for calculating ultrafast pulse distribution.
  • Keywords
    atomic force microscopy; high-speed optical techniques; optical microscopy; optoelectronic devices; voltage distribution; voltage measurement; coplanar strip; picosecond electrical pulse; scanning force microscope; scanning force optoelectronic microscope; ultrafast optical sampling; voltage distribution imaging; Laser mode locking; Optical microscopy; Optical pulse generation; Optical pulses; Probes; Sampling methods; Strips; Switches; Ultrafast optics; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1997., IEEE MTT-S International
  • Conference_Location
    Denver, CO, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-3814-6
  • Type

    conf

  • DOI
    10.1109/MWSYM.1997.596700
  • Filename
    596700