DocumentCode :
2492597
Title :
Image observation of pico second electrical pulse by scanning force optoelectronic microscope
Author :
Takeuchi, K. ; Mizuhara, A.
Author_Institution :
Teratec Corp., Musashino, Japan
Volume :
3
fYear :
1997
fDate :
8-13 June 1997
Firstpage :
1643
Abstract :
We succeeded for the first time in visualizing instantaneous voltage distribution of 2ps electrical pulse propagating on coplanar strips (CPS). This result was obtained using a scanning force optoelectronic microscope (SFOEM) which we have developed by coupling a scanning force microscope (SFM) and an ultrafast optical sampling technique. The observed voltage distribution shows a single peak deviating outward. The result seems not consistent with a simple theoretical prediction. There is a possibility that simple theoretical treatments usually used are no more useful for calculating ultrafast pulse distribution.
Keywords :
atomic force microscopy; high-speed optical techniques; optical microscopy; optoelectronic devices; voltage distribution; voltage measurement; coplanar strip; picosecond electrical pulse; scanning force microscope; scanning force optoelectronic microscope; ultrafast optical sampling; voltage distribution imaging; Laser mode locking; Optical microscopy; Optical pulse generation; Optical pulses; Probes; Sampling methods; Strips; Switches; Ultrafast optics; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1997., IEEE MTT-S International
Conference_Location :
Denver, CO, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-3814-6
Type :
conf
DOI :
10.1109/MWSYM.1997.596700
Filename :
596700
Link To Document :
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