Microscopic observation of the temperature coefficient distribution of dielectric material for microwave application using scanning photothermal dielectric microscope

Author

Cho, Y. ; Kasahara, T. ; Fukuda, K.

Author_Institution

Dept. Electr. & Electron. Eng., Yamaguchi Univ., Ube, Japan

Volume

3

fYear

1997

fDate

8-13 June 1997

Firstpage

1647

Abstract

Two dimensional images of the temperature coefficient of the distribution of the dielectric constant of a two phases composite ceramics composed of TiO/sub 2/ and Bi/sub 2/Ti/sub 4/O/sub 11/ are observed using scanning photothermal dielectric microscope. The obtained images clearly show that the each grain of TiO/sub 2/ and Bi/sub 2/Ti/sub 4/O/sub 11/ in the ceramics has a negative and a positive temperature coefficient, respectively and that the macroscopic averaged temperature coefficient of the ceramics is relatively low due to the cancellation of the coefficients with the opposite signs.

Keywords

bismuth compounds; ceramics; dielectric materials; microscopy; microwave measurement; permittivity measurement; photothermal effects; titanium compounds; TiO/sub 2/-Bi/sub 2/Ti/sub 4/O/sub 11/; dielectric constant; dielectric material; microwave application; scanning photothermal dielectric microscope; temperature coefficient distribution; two dimensional image; two phase composite ceramic; Capacitance; Ceramics; Dielectric constant; Dielectric materials; Dielectric measurements; Electrodes; Frequency; Microscopy; Temperature distribution; Temperature sensors;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1997., IEEE MTT-S International

Conference_Location

Denver, CO, USA

ISSN

0149-645X

Print_ISBN

0-7803-3814-6

Type

conf

DOI

10.1109/MWSYM.1997.596704

Filename

596704