Title :
Impact of Scaling on CMOS Radio Frequency Class-E Power Amplifiers
Author :
Brama, Riccardo ; Larcher, Luca ; Mazzanti, Andrea ; Svelto, Francesco
Author_Institution :
DISMI, Univ. degli Studi di Modena e Reggio Emilia
Abstract :
Although technological scaling is beneficial for CMOS ICs for digital applications, it impacts seriously on analog and radio frequency circuit performances. In this scenario, this paper investigates power loss mechanisms in class-E power amplifiers highlighting their dependencies on technological scaling. An analytical model describing PA power added efficiency is obtained, and its results are validated against circuit simulations. Scaling effects on efficiency are modeled and discussed, showing that class-E PA performance are not significantly affected by scaling when delivering low-medium output power, contrarily to what is commonly believed
Keywords :
CMOS integrated circuits; power amplifiers; radiofrequency integrated circuits; CMOS integrated circuits; class-E power amplifiers; power added efficiency; power loss; radiofrequency integrated circuits; Analytical models; CMOS analog integrated circuits; CMOS digital integrated circuits; CMOS technology; Circuit simulation; High power amplifiers; Power amplifiers; Power generation; Radio frequency; Radiofrequency amplifiers;
Conference_Titel :
Research in Microelectronics and Electronics 2006, Ph. D.
Conference_Location :
Otranto
Print_ISBN :
1-4244-0157-7
DOI :
10.1109/RME.2006.1690000
