Title :
T-Proc: An Embedded IEEE1500-Wrapped Cores Tester
Author :
Tuna, Matthieu ; Benabdenbi, Mounir ; Greiner, Alain
Author_Institution :
Univ. of Pierre et Marie Curie, Paris
Abstract :
This paper presents a software-based approach for testing IEEE1500-compliant SoCs. In the proposed approach, the test program is no more executed by the external-traditional tester but by the SoC itself. The novel feature is the use of a dedicated test processor called T-Proc embedded onto the SoC to test the components. Under the control of the embedded SoC microprocessor, the test processor executes the test programs stored in the outside external memory, through a functional embedded external RAM controller interface. Using the ITC02 SoC benchmarks a comparison is done between T-Proc and a classical bus-based test strategy
Keywords :
automatic test software; electronic engineering computing; embedded systems; integrated circuit testing; microprocessor chips; system-on-chip; IEEE 1500; T-Proc; embedded SoC microprocessor; external RAM controller interface; silicon-on-chip; test processor; test program; wrapped cores tester; Automatic testing; Benchmark testing; Built-in self-test; Circuit testing; Frequency; Microprocessors; Software testing; System testing; System-on-a-chip; Test pattern generators;
Conference_Titel :
Research in Microelectronics and Electronics 2006, Ph. D.
Conference_Location :
Otranto
Print_ISBN :
1-4244-0157-7
DOI :
10.1109/RME.2006.1690001