Title :
Utility of algebraic connectivity metric in topology design of survivable networks
Author :
Liu, W. ; Sirisena, H. ; Pawlikowski, K. ; McInnes, A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Canterbury, Christchurch, New Zealand
Abstract :
In studies of survivable networks, it is important to be able to differentiate network topologies by means of a robust numerical measure that indicates the levels of immunity of these topologies to failures of their nodes and links. Ideally, such a measure should be sensitive to the existence of nodes or links which are more important than others, for example, if their failures cause the network´s disintegration. In this paper, we suggest using an algebraic connectivity metric, adopted from spectral graph theory, namely the 2nd smallest eigenvalue of the Laplacian matrix of the network topology, instead of the average nodal degree that is usually used to characterize network connectivity in studies of the spare capacity allocation problem. Extensive simulation studies confirm that this metric is a more informative and more accurate parameter than the average nodal degree for characterizing network topologies in survivability studies.
Keywords :
Laplace equations; eigenvalues and eigenfunctions; graph theory; telecommunication network reliability; telecommunication network topology; Laplacian matrix; algebraic connectivity metric; eigenvalue; network connectivity; network disintegration; network topology; spare capacity allocation; spectral graph theory; survivable networks; topology design; Computer networks; Computer science; Design engineering; Eigenvalues and eigenfunctions; Laplace equations; Network topology; Next generation networking; Protection; Robustness; Software engineering; 2nd smallest eigenvalue; ILP; Laplacian matrix; Network survivability; SBPP; algebraic connectivity metric; network connectivity; spare capacity allocation; topology design;
Conference_Titel :
Design of Reliable Communication Networks, 2009. DRCN 2009. 7th International Workshop on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-5047-3
DOI :
10.1109/DRCN.2009.5340016