Title :
Implementation of a Dual-Interrogation-Mode Embroidered RFID-Enabled Strain Sensor
Author :
Hasani, Masoumeh ; Vena, Arnaud ; Sydanheimo, Lauri ; Ukkonen, Leena ; Tentzeris, Manos M.
Author_Institution :
Tampere Univ. of Technol., Tampere, Finland
Abstract :
This letter studies a dual-interrogation-mode (hybrid chip-enabled/chipless) technique to detect an embroidered radio frequency identification (RFID)-enabled sensor. We have created a hybrid RFID strain sensor utilizing both chipped and chipless approaches. A comparison between the read-range extraction technique, which relies upon the detection of the threshold power that is required to activate an RFID IC, and a radar-cross-section (RCS)-based technique that does not require any protocol is presented. An embroidered RFID sensor with an electrical length that is directly linked to the applied strain is realized and interrogated using both techniques. The sensitivities for the chipless radar technique and for the chip-enabled read range extraction technique are 0.66% and 0.43% frequency shift, respectively, for 1% strain variation. Simulations and measurements validate the dual interrogation mode and provide the proof of concept that a chip-enabled RFID sensor tag can be detected accurately utilizing backscattering RCS measurements.
Keywords :
protocols; radar cross-sections; radiofrequency identification; radiofrequency integrated circuits; strain sensors; RCS-based technique; RFID IC; RFID-enabled sensor; applied strain; backscattering RCS measurements; chip-enabled RFID sensor tag; chip-enabled read range extraction technique; chipless radar technique; chipless technique; dual interrogation mode; dual-interrogation-mode embroidered RFID-enabled strain sensor; electrical length; embroidered RFID sensor; embroidered radio frequency identification-enabled sensor; frequency shift; hybrid RFID strain sensor; hybrid chip-enabled technique; protocol; radar-cross-section-based technique; read-range extraction technique; threshold power detection; Antenna measurements; Antennas; Radar cross-sections; Radiofrequency identification; Semiconductor device measurement; Strain; Chip; chipless; embroidery strain sensors; radar cross section (RCS); radar technique; radio frequency identification (RFID); stress; wireless sensors;
Journal_Title :
Antennas and Wireless Propagation Letters, IEEE
DOI :
10.1109/LAWP.2013.2283539