DocumentCode
249409
Title
Phase imaging via sparse coding in the complex domain based on high-order svd and nonlocal BM3D techniques
Author
Katkovnik, Vladimir ; Egiazarian, Karen ; Bioucas-Dias, Jose
Author_Institution
Signal Process. Dept., Tampere Univ. of Technol., Tampere, Finland
fYear
2014
fDate
27-30 Oct. 2014
Firstpage
4587
Lastpage
4591
Abstract
The paper addresses interferometric phase image estimation, that is, the estimation of phase modulo-2π images from sinusoidal 2π-periodic and noisy observations. These degradation mechanisms make interferometric phase image estimation a challenging problem. We tackle this challenge by reformulating the true estimation problem as a sparse regression in the complex domain. Following the standard procedure in patch-based image restoration, the image is partitioned into small overlapping square patches. BM3D algorithm equipped with high order SVD (HOSVD) is used to form complex domain frames suitable to sparse representations of the complex-valued data. HOSVD applied to the groups of BM3D data enables the design of spatially variant and data adaptive orthonormal complex domain transforms. The effectiveness of the new sparse coding based approach to interferometric phase estimation, termed Interferometric PHASE via Block matching and High order SVD (InPHASE-BHS) is illustrated in a series of simulation experiments where it outperforms the state-of-the-art.
Keywords
estimation theory; image coding; image restoration; regression analysis; singular value decomposition; block matching; complex domain; estimation problem; high-order SVD; interferometric phase image estimation; nonlocal BM3D techniques; patch-based image restoration; phase imaging; sparse coding; sparse regression; Estimation; Imaging; Noise measurement; Optical interferometry; Tensile stress; Three-dimensional displays; Transforms; BM3D; Phase imaging; high order SVD; interferometric phase estimation; phase unwrapping; sparse regression;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing (ICIP), 2014 IEEE International Conference on
Conference_Location
Paris
Type
conf
DOI
10.1109/ICIP.2014.7025930
Filename
7025930
Link To Document