• DocumentCode
    249434
  • Title

    Gabor-based patch covariance matrix for face sketch synthesis

  • Author

    Jian Guan ; Ruimin Hu ; Junjun Jiang ; Zhen Han

  • Author_Institution
    Nat. Eng. Res. Center for Multimedia Software, Wuhan Univ., Wuhan, China
  • fYear
    2014
  • fDate
    27-30 Oct. 2014
  • Firstpage
    4642
  • Lastpage
    4646
  • Abstract
    In this paper, we propose a novel face sketch/photo synthesis method by utilizing Gabor-based Patch Covariance Matrix (GPCM) as face descriptor, a.k.a. symmetric positive definite matrix, which lie on a Riemannian manifold. In particular, both pixel locations and Gabor coefficients of one patch are employed to form the covariance matrix. In this way, the sketch/photo can be then transformed from the pixel space to the Riemannian manifold space. With the aid of the recently introduced Stein kernel theory, we advance to perform Regularized Least Square Representation (RLSR) in Stein space. Based on the assumption that the Stein divergence manifold of photo/sketch patch and the sketch/photo share the same topology, a new sketch/photo patch of the same position can be synthesized by keeping the weights and replacing the photo/sketch training image patches with the corresponding sketch/photo ones. Experimental results demonstrate the superiority of the proposed method.
  • Keywords
    covariance matrices; face recognition; least squares approximations; GPCM; Gabor coefficients; Gabor-based patch covariance matrix; RLSR; Riemannian manifold space; Stein divergence manifold; Stein kernel theory; face descriptor; face sketch/photo synthesis method; photo/sketch training image patch; pixel locations; pixel space; regularized least square representation; sketch/photo share; symmetric positive definite matrix; Covariance matrices; Databases; Face; Face recognition; Kernel; Training; Vectors; Gabor; Stein divergence; covariance matrix; sketch/photo synthesis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2014 IEEE International Conference on
  • Conference_Location
    Paris
  • Type

    conf

  • DOI
    10.1109/ICIP.2014.7025941
  • Filename
    7025941