• DocumentCode
    2494404
  • Title

    Fabrication and testing of memristive devices

  • Author

    Yakopcic, Chris ; Shin, Eunsung ; Taha, Tarek M. ; Subramanyam, Guru ; Murray, P. Terrence ; Rogers, Stanley

  • Author_Institution
    Dept. of ECE, Univ. of Dayton, Dayton, OH, USA
  • fYear
    2010
  • fDate
    18-23 July 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    As semiconductor devices have shrunk further into the nanoscale regime, a new device, the memristor, has been discovered that has the potential to transform neuromorphic computing systems. This device is considered as the fourth fundamental circuit element. It was first theorized by Dr. Leon Chua in 1971 and has been discovered by HP labs in 2008. This paper describes initial efforts at fabricating the memristor devices and examining their properties. Two versions of memristor devices have been fabricated at the University of Dayton and the Air Force Research Laboratory utilizing varying thicknesses of the TiO2 dielectric layers. Our results show that the devices do exhibit the characteristic hysteresis loop in their I-V plots. Further refinement in the devices to achieve stronger hysteresis will be carried out as future work.
  • Keywords
    dielectric materials; dielectric properties; memristors; nanoelectronics; semiconductor device testing; titanium compounds; TiO2; circuit element; dielectric layers; memristive device testing; neuromorphic computing systems; semiconductor devices; Electronic mail; Magnetic devices; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Networks (IJCNN), The 2010 International Joint Conference on
  • Conference_Location
    Barcelona
  • ISSN
    1098-7576
  • Print_ISBN
    978-1-4244-6916-1
  • Type

    conf

  • DOI
    10.1109/IJCNN.2010.5596755
  • Filename
    5596755