Title :
Processor design and implementation for real-time testing of embedded systems
Author :
Walters, G. ; King, E. ; Kessinger, R. ; Fryer, R.
Author_Institution :
CPU Tech., Pleasanton, CA, USA
fDate :
31 Oct-7 Nov 1998
Abstract :
As more complex devices with higher levels of integration are inserted into real-time systems, traditional testing methods are becoming obsolete. The most difficult obstacle to thorough testing of real time embedded systems is the lack of visibility into the operations of processing elements while application software is executing. It is now possible to design and implement processors for embedded applications that are binary compatible with commercial instruction sets and have specific features for visibility to facilitate the test, debug, and maintenance of real-time processing systems. These features include Real Time Non-intrusive Instrumentation (RTNI) and Behavioral Verification TechnologyTM (BVTTM) and do not interfere in any way in the operation of the system. RTNI increases developer productivity by enabling direct observation of processor operation during system development, support and maintenance. BVT is used to automatically test the correct functional behavior of the integrated hardware and software against the system specification. The combination of RTNI and BVT significantly reduces system validation time, risk and cost, while increasing the coverage and assurance level. These features can be implemented in processors that are very high performance, low power, commercial grade, or radiation-hardened. Application of this approach is underway in the development of processors for military and commercial applications
Keywords :
application program interfaces; automatic test software; avionics; development systems; embedded systems; instruction sets; microprocessor chips; program debugging; program diagnostics; program testing; software performance evaluation; ASIC FPGA; COTS microprocessors; automatic test; avionics systems; behavioral verification technology; binary compatible; commercial instruction sets; correct functional behavior; debug functions; developer productivity; direct observation; embedded systems; general-purpose diagnostic port architecture; implementation; integrated hardware and software; processor design; processor operation; real time non-intrusive instrumentation; real-time testing; system validation time; Application software; Automatic testing; Embedded system; Instruction sets; Instruments; Process design; Productivity; Real time systems; Software testing; System testing;
Conference_Titel :
Digital Avionics Systems Conference, 1998. Proceedings., 17th DASC. The AIAA/IEEE/SAE
Conference_Location :
Bellevue, WA
Print_ISBN :
0-7803-5086-3
DOI :
10.1109/DASC.1998.741470