• DocumentCode
    2494820
  • Title

    Flip chip attachment using anisotropic conductive adhesives and electroless nickel bumps

  • Author

    Aschenbrenner, R. ; Ostmann, A. ; Motulla, G. ; Zakel, E. ; Reichl, H.

  • Author_Institution
    Fraunhofer-Inst. fur Zuverlassigleit und Mikrointegration, Berlin, Germany
  • fYear
    1996
  • fDate
    14-16 Oct 1996
  • Firstpage
    26
  • Lastpage
    33
  • Abstract
    Flip chip attachments provide the highest interconnection density possible, which makes this technology very attractive for use with liquid crystal display (LCD) packaging methods. This technology stimulated the development of new interconnection techniques, such as anisotropic adhesives. However, several factors have hindered the wide use of this technology. These factors include the availability and costs of bumped wafers. IZM and TU-Berlin have addressed both of these concerns by establishing a wafer-bumping facility which uses electroless nickel bumps. The combination of anisotropic adhesives and electroless nickel bumps has the potential for a low-cost chip on glass (COG) and chip on flex (COF) bonding technology. In this paper two types of anisotropic adhesives were studied with an emphasis on the properties of COG and COF interconnections. The electrical and mechanical performance of the adhesive bonds was studied by evaluating initial contact resistance and mechanical adhesion as a function of temperature and humidity
  • Keywords
    contact resistance; flip-chip devices; integrated circuit interconnections; integrated circuit packaging; liquid crystal displays; wafer bonding; LCD packaging methods; Ni; anisotropic adhesives; anisotropic conductive adhesives; bumped wafers; chip on flex bonding technology; chip on glass technology; contact resistance; electroless bumps; flip chip attachment; interconnection density; interconnection techniques; liquid crystal display; mechanical adhesion; mechanical performance; wafer-bumping facility; Anisotropic magnetoresistance; Conductive adhesives; Contact resistance; Costs; Flip chip; Glass; Liquid crystal displays; Nickel; Packaging; Wafer bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 1996., Nineteenth IEEE/CPMT
  • Conference_Location
    Austin, TX
  • ISSN
    1089-8190
  • Print_ISBN
    0-7803-3642-9
  • Type

    conf

  • DOI
    10.1109/IEMT.1996.559678
  • Filename
    559678