DocumentCode
2494820
Title
Flip chip attachment using anisotropic conductive adhesives and electroless nickel bumps
Author
Aschenbrenner, R. ; Ostmann, A. ; Motulla, G. ; Zakel, E. ; Reichl, H.
Author_Institution
Fraunhofer-Inst. fur Zuverlassigleit und Mikrointegration, Berlin, Germany
fYear
1996
fDate
14-16 Oct 1996
Firstpage
26
Lastpage
33
Abstract
Flip chip attachments provide the highest interconnection density possible, which makes this technology very attractive for use with liquid crystal display (LCD) packaging methods. This technology stimulated the development of new interconnection techniques, such as anisotropic adhesives. However, several factors have hindered the wide use of this technology. These factors include the availability and costs of bumped wafers. IZM and TU-Berlin have addressed both of these concerns by establishing a wafer-bumping facility which uses electroless nickel bumps. The combination of anisotropic adhesives and electroless nickel bumps has the potential for a low-cost chip on glass (COG) and chip on flex (COF) bonding technology. In this paper two types of anisotropic adhesives were studied with an emphasis on the properties of COG and COF interconnections. The electrical and mechanical performance of the adhesive bonds was studied by evaluating initial contact resistance and mechanical adhesion as a function of temperature and humidity
Keywords
contact resistance; flip-chip devices; integrated circuit interconnections; integrated circuit packaging; liquid crystal displays; wafer bonding; LCD packaging methods; Ni; anisotropic adhesives; anisotropic conductive adhesives; bumped wafers; chip on flex bonding technology; chip on glass technology; contact resistance; electroless bumps; flip chip attachment; interconnection density; interconnection techniques; liquid crystal display; mechanical adhesion; mechanical performance; wafer-bumping facility; Anisotropic magnetoresistance; Conductive adhesives; Contact resistance; Costs; Flip chip; Glass; Liquid crystal displays; Nickel; Packaging; Wafer bonding;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Manufacturing Technology Symposium, 1996., Nineteenth IEEE/CPMT
Conference_Location
Austin, TX
ISSN
1089-8190
Print_ISBN
0-7803-3642-9
Type
conf
DOI
10.1109/IEMT.1996.559678
Filename
559678
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