Title :
Terahertz thin film and refractive index sensing with a metamaterial near-field sensor
Author :
Reinhard, B. ; Schmitt, K.M. ; Wollrab, V. ; Neu, J. ; Beigang, R. ; Rahm, M.
Author_Institution :
Dept. of Phys., Univ. of Kaiserslautern, Kaiserslautern, Germany
Abstract :
We present a metamaterial-based sensor for use at terahertz (THz) frequencies that is suitable for the measurement of the thickness and the refractive index of a dielectric sample material. The sensor is designed to operate in reflection geometry in the frequency range between 1 THz and 1.6 THz. Deep-subwavelength sample thicknesses as small as 1/16000 of the operating wavelength can be resolved as well as refractive index differences of 0.01.
Keywords :
dielectric materials; refractive index measurement; terahertz metamaterials; terahertz wave detectors; thickness measurement; thin film sensors; dielectric sample material; frequency 1 THz to 1.6 THz; metamaterial near field sensor; reflection geometry; refractive index measurement; terahertz thin film sensor; thickness measurement; Liquids; Metamaterials; Refractive index; Resonant frequency; Silicon; Substrates;
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2012 37th International Conference on
Conference_Location :
Wollongong, NSW
Print_ISBN :
978-1-4673-1598-2
Electronic_ISBN :
2162-2027
DOI :
10.1109/IRMMW-THz.2012.6379516
