Title :
Final X-Ray Control of the Orientation of Round or Rectangular Quartz Slides for Industrial Purposes
Author :
Darces, J.F. ; Merigoux, H.
Keywords :
Automatic control; Crystallography; Diffraction; Industrial control; Laboratories; Optical resonators; Particle measurements; Rotation measurement; X-ray detection; X-ray detectors;
Conference_Titel :
32nd Annual Symposium on Frequency Control. 1978
DOI :
10.1109/FREQ.1978.200253