Title :
Goniometric Measurements of the Angles of Cut of Doubly Rotated Quartz Plates
Author :
Clastre, J. ; Pegeot, C. ; Leroy, P.Y.
Keywords :
Atomic measurements; Crystals; Electric variables measurement; Frequency; Goniometers; Reflection; Rotation measurement; Silicon compounds; Tellurium; Temperature;
Conference_Titel :
32nd Annual Symposium on Frequency Control. 1978
DOI :
10.1109/FREQ.1978.200254
