• DocumentCode
    2495028
  • Title

    FASE: a scheduling environment for semiconductor fabrication

  • Author

    Shiu, Jiun ; Hwang, Ting-Kai ; Huang, Yen- Wen ; Tsai, Chiou-Ming ; Su, Wei-Min ; Cheng, Ya ; Chang, Shi-Chung ; Chien, Cheng-Chung

  • Author_Institution
    CyberLink Corp., Taipei, Taiwan
  • fYear
    1996
  • fDate
    14-16 Oct 1996
  • Firstpage
    34
  • Lastpage
    41
  • Abstract
    FASE is a computer-aided scheduling environment developed for semiconductor fabrication. Its current version includes: (1) a mid-term and daily scheduler, (2) a machine variability analyzer, (3) a what-if analysis tool and (4) a friendly graphic user interface (GUI). The scheduler is extended from an optimization-based scheduler for a R&D pilot line to a mass production fab application. To identify capacity and cycle time bottlenecks, a variability analyzer is developed, which functions jointly with the scheduler. The what-if analysis tool combines GUI technique, the scheduler and the variability analyzer to answer what-if questions on capacity variation, desired output variation, etc. Test results using field data indicate that FASE provides an decision aid in addressing many issues encountered in scheduling semiconductor fabrication
  • Keywords
    computer aided production planning; graphical user interfaces; integrated circuit manufacture; production control; semiconductor device manufacture; FASE; capacity; computer-aided scheduling; cycle time bottlenecks; graphic user interface; machine variability analyzer; mass production fab; optimization-based scheduler; output variation; scheduling environment; semiconductor fabrication; what-if analysis tool; Computer graphics; Dynamic scheduling; Fabrication; Graphical user interfaces; Job shop scheduling; Mass production; Processor scheduling; Research and development; Semiconductor device testing; User interfaces;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 1996., Nineteenth IEEE/CPMT
  • Conference_Location
    Austin, TX
  • ISSN
    1089-8190
  • Print_ISBN
    0-7803-3642-9
  • Type

    conf

  • DOI
    10.1109/IEMT.1996.559679
  • Filename
    559679