Title :
The Measurement of Load Resonance Characteristics of Quartz Crystal Using the Zero Phase II-Network
Author :
Hughes, S.J. ; Parfitt, R.W. ; Hardy, J.S.
Keywords :
Capacitors; Circuits; Electrical resistance measurement; IEC standards; Phase measurement; Resistors; Resonance; Resonant frequency; Substrates; Thick films;
Conference_Titel :
32nd Annual Symposium on Frequency Control. 1978
DOI :
10.1109/FREQ.1978.200259
