Title :
Image processing for materials characterization: Issues, challenges and opportunities
Author :
Duval, L. ; Moreaud, M. ; Couprie, C. ; Jeulin, D. ; Talbot, H. ; Angulo, J.
Author_Institution :
Comp. Sci. & Appl. Math. Dept., IFP Energies nouvelles Technol., France
Abstract :
This introductory paper aims at summarizing some problems and state-of-the-art techniques encountered in image processing for material analysis and design. Developing generic methods for this purpose is a complex task given the variability of the different image acquisition modalities (optical, scanning or transmission electron microscopy; surface analysis instrumentation, electron tomography, micro-tomography ...), and material composition (porous, fibrous, granular, hard materials, membranes, surfaces and interfaces ...). This paper presents an overview of techniques that have been and are currently developed to address this diversity of problems, such as segmentation, texture analysis, multiscale and directional features extraction, stochastic models and rendering, among others. Finally, it provides references to enter the issues, challenges and opportunities in materials characterization.
Keywords :
image processing; materials science computing; directional feature extraction; electron tomography; image acquisition modalities; image processing; material analysis; material characterization; material composition; material design; multiscale feature extraction; rendering; scanning electron microscopy; stochastic models; surface analysis instrumentation; texture analysis; transmission electron microscopy; Image segmentation; Materials; Microstructure; Scanning electron microscopy; Three-dimensional displays; Image Processing; Image-based Analysis; Materials science; Stochastic modeling; Surface Science; Texture Analysis; Work-flow;
Conference_Titel :
Image Processing (ICIP), 2014 IEEE International Conference on
Conference_Location :
Paris
DOI :
10.1109/ICIP.2014.7025985