DocumentCode :
249527
Title :
Physics of MRF regularization for segmentation of materials microstructure images
Author :
Simmons, Jeff ; Przybyla, Craig ; Bricker, Stephen ; Dae Woo Kim ; Comer, Mary
Author_Institution :
Mater. & Manuf. Directorate, Air Force Res. Lab., Dayton, OH, USA
fYear :
2014
fDate :
27-30 Oct. 2014
Firstpage :
4882
Lastpage :
4886
Abstract :
The Markov Random Field (MRF) has been used extensively in Image Processing as a means of smoothing interfaces between differing regions in an image. The MRF applies a total boundary length `energy´ penalty that is subsequently minimized by an inversion algorithm. The minimization of energy implies a force associated with boundaries, the sum of which must equal zero at every point at equilibrium. This requirement leads to long range interactions, resulting from the short-range interactions of the MRF, which biases segmentation results. This work uses a simple Bayesian MRF regularized segmentation method to show that classical results from Surface Science are reproduced when segmenting regions of low contrast. This has implications, both in the Materials Science and Image Processing fields.
Keywords :
Markov processes; image segmentation; materials science computing; Bayesian MRF regularized segmentation method; Markov random field; energy penalty; equilibrium point; image processing; image segmentation; inversion algorithm; materials microstructure images; materials science; surface science; Image segmentation; Materials; Mathematical model; Monte Carlo methods; Physics; Surface treatment; context-sensitive segmentation; materials science; priors; segmentation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2014 IEEE International Conference on
Conference_Location :
Paris
Type :
conf
DOI :
10.1109/ICIP.2014.7025989
Filename :
7025989
Link To Document :
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