DocumentCode
249527
Title
Physics of MRF regularization for segmentation of materials microstructure images
Author
Simmons, Jeff ; Przybyla, Craig ; Bricker, Stephen ; Dae Woo Kim ; Comer, Mary
Author_Institution
Mater. & Manuf. Directorate, Air Force Res. Lab., Dayton, OH, USA
fYear
2014
fDate
27-30 Oct. 2014
Firstpage
4882
Lastpage
4886
Abstract
The Markov Random Field (MRF) has been used extensively in Image Processing as a means of smoothing interfaces between differing regions in an image. The MRF applies a total boundary length `energy´ penalty that is subsequently minimized by an inversion algorithm. The minimization of energy implies a force associated with boundaries, the sum of which must equal zero at every point at equilibrium. This requirement leads to long range interactions, resulting from the short-range interactions of the MRF, which biases segmentation results. This work uses a simple Bayesian MRF regularized segmentation method to show that classical results from Surface Science are reproduced when segmenting regions of low contrast. This has implications, both in the Materials Science and Image Processing fields.
Keywords
Markov processes; image segmentation; materials science computing; Bayesian MRF regularized segmentation method; Markov random field; energy penalty; equilibrium point; image processing; image segmentation; inversion algorithm; materials microstructure images; materials science; surface science; Image segmentation; Materials; Mathematical model; Monte Carlo methods; Physics; Surface treatment; context-sensitive segmentation; materials science; priors; segmentation;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing (ICIP), 2014 IEEE International Conference on
Conference_Location
Paris
Type
conf
DOI
10.1109/ICIP.2014.7025989
Filename
7025989
Link To Document