• DocumentCode
    249527
  • Title

    Physics of MRF regularization for segmentation of materials microstructure images

  • Author

    Simmons, Jeff ; Przybyla, Craig ; Bricker, Stephen ; Dae Woo Kim ; Comer, Mary

  • Author_Institution
    Mater. & Manuf. Directorate, Air Force Res. Lab., Dayton, OH, USA
  • fYear
    2014
  • fDate
    27-30 Oct. 2014
  • Firstpage
    4882
  • Lastpage
    4886
  • Abstract
    The Markov Random Field (MRF) has been used extensively in Image Processing as a means of smoothing interfaces between differing regions in an image. The MRF applies a total boundary length `energy´ penalty that is subsequently minimized by an inversion algorithm. The minimization of energy implies a force associated with boundaries, the sum of which must equal zero at every point at equilibrium. This requirement leads to long range interactions, resulting from the short-range interactions of the MRF, which biases segmentation results. This work uses a simple Bayesian MRF regularized segmentation method to show that classical results from Surface Science are reproduced when segmenting regions of low contrast. This has implications, both in the Materials Science and Image Processing fields.
  • Keywords
    Markov processes; image segmentation; materials science computing; Bayesian MRF regularized segmentation method; Markov random field; energy penalty; equilibrium point; image processing; image segmentation; inversion algorithm; materials microstructure images; materials science; surface science; Image segmentation; Materials; Mathematical model; Monte Carlo methods; Physics; Surface treatment; context-sensitive segmentation; materials science; priors; segmentation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2014 IEEE International Conference on
  • Conference_Location
    Paris
  • Type

    conf

  • DOI
    10.1109/ICIP.2014.7025989
  • Filename
    7025989