DocumentCode
2495374
Title
Cost-efficient Automated Visual Inspection system for small manufacturing industries based on SIFT
Author
Bohlool, Mehdy ; Taghanaki, Soroosh Rahimi
Author_Institution
Eng. Dept., Shahid Chamran Univ., Ahvaz
fYear
2008
fDate
26-28 Nov. 2008
Firstpage
1
Lastpage
6
Abstract
This paper presents a cost efficient automated visual inspection (AVI) system for small industriespsila quality control system. The complex hardware and software make current AVI systems too expensive to afford for small-size manufacturing industries. Proposed approach to AVI systems is based on an ordinary PC with a medium resolution camera without any other extra hardware. The scale invariant feature transform (SIFT) is used to acquire good accuracy and make it applicable for different situations with different sample sizes, positions, and illuminations. Proposed method can detect three different defect types as well as locating and measuring defect percentage for more specialized utilization. To evaluate the performance of this system different samples with different sizes, shapes, and complexities are used and the results show that proposed system is highly applicable to different applications and is invariant to noise, illumination changes, rotation, and transformation.
Keywords
automatic optical inspection; production engineering computing; quality control; transforms; SIFT; cost-efficient automated visual inspection system; quality control system; scale invariant feature transform; small manufacturing industries; Cameras; Costs; Electrical equipment industry; Hardware; Industrial control; Inspection; Lighting; Manufacturing industries; Quality control; Shape; Automated Visual Inspection; Computer Vision; Mathematical Morphology; Quality Control; Scale Invariant Feature Transform;
fLanguage
English
Publisher
ieee
Conference_Titel
Image and Vision Computing New Zealand, 2008. IVCNZ 2008. 23rd International Conference
Conference_Location
Christchurch
Print_ISBN
978-1-4244-3780-1
Electronic_ISBN
978-1-4244-2583-9
Type
conf
DOI
10.1109/IVCNZ.2008.4762145
Filename
4762145
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