Title :
Proceedings Seventh Asian Test Symposium (ATS´98) (Cat. No.98TB100259)
Abstract :
The following topics were dealt with. BIST; high level synthesis; delay testing; fault modelling; software testing; current testing; sequential testing; boundary scan testing; interconnect testing; FPGA testing; fault tolerance; IDDQ testing; memory testing; mixed signal testing; design verification; and ATPG
Keywords :
automatic test pattern generation; boundary scan testing; built-in self test; delays; fault diagnosis; high level synthesis; integrated circuit testing; logic testing; mixed analogue-digital integrated circuits; program testing; ATPG; BIST; FPGA testing; IDDQ testing; boundary scan testing; current testing; delay testing; design verification; fault modelling; fault tolerance; high level synthesis; interconnect testing; memory testing; mixed signal testing; sequential testing; software testing;
Conference_Titel :
Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian
Conference_Location :
Singapore
Print_ISBN :
0-8186-8277-9
DOI :
10.1109/ATS.1998.741564
