Title :
A methodology for minimum area cellular automata generation
Author :
Cardoso, Paulo Sergio ; Strum, Marius ; de A.Amazonas, J.R. ; Chau, Wang Jiang
Author_Institution :
Dept. de Engenharia Electron., Sao Paulo Univ., Brazil
Abstract :
Cellular automata (CAs) have been adopted in several VLSI applications to generate pseudo-random sequences. CAs should be able to generate maximum cycle length pseudo-random sequences. As they are built into high performance VLSI chips they should also present minimum area. Previous works on CAs generation have failed, up to now, to solve the problem. In this paper we present a “guided search” methodology to generate such minimum area CAs. Results are compared to the ones obtained in previous works and the area gain reported
Keywords :
VLSI; automatic test pattern generation; binary sequences; built-in self test; cellular automata; integrated circuit testing; ATPG; BIST; VLSI applications; area gain; cellular automata generation; guided search; maximum cycle length; minimum area cellular automata; pseudo-random sequences; Automata; Automatic test pattern generation; Automatic testing; Built-in self-test; Circuit testing; Content addressable storage; Equations; Linear feedback shift registers; Polynomials; Spread spectrum communication; Test pattern generators; Yttrium;
Conference_Titel :
Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian
Print_ISBN :
0-8186-8277-9
DOI :
10.1109/ATS.1998.741577
