• DocumentCode
    2496035
  • Title

    High Temperature SQI CMOS Tungsten Micro-Heaters

  • Author

    Ali, Syed Zishan ; Guha, P.K. ; Lee, C.C.C. ; Udrea, F. ; Milne, W.I. ; Iwaki, T. ; Covington, J. ; Gardner, Julian W.

  • Author_Institution
    Cambridge Univ., Cambridge
  • fYear
    2006
  • fDate
    22-25 Oct. 2006
  • Firstpage
    847
  • Lastpage
    850
  • Abstract
    Here we present for the first time, the design, fabrication and characterization of novel high temperature SOI micro-hotplates employing tungsten resistive heaters. Tungsten has a high operating temperature, good mechanical strength, and could be used for CMOS interconnects. These devices have been fabricated using a commercial SOI-CMOS process followed by a DR1E back-etch step, offering low cost and the option of circuit integration. Here we report on micro-hotplates with two different diameters (560mum and 300mum), 3D electro-thermal simulation in ANSYS and their electro-thermal characterization. Results show that these devices can operate at a high temperature (600degC), have ultra low DC power consumption (12mW at 600degC), fast transient time (as low as 2ms to 600degC), stability in time and temperature and, more importantly, a high reproducibility both within a wafer and from wafer to wafer. The SOI micro-hotplates could be used in fully integrated micro-calorimeters or resistive gas sensors.
  • Keywords
    CMOS integrated circuits; gas sensors; high-temperature electronics; microsensors; silicon-on-insulator; tungsten; 3D electro thermal simulation; ANSYS; CMOS; DC power consumption; SOI; W; circuit integration; high temperature; micro hotplates; power 12 mW; temperature 600 C; tungsten microheaters; tungsten resistive heaters; Circuit simulation; Costs; Energy consumption; Fabrication; Gas detectors; Integrated circuit interconnections; Reproducibility of results; Stability; Temperature sensors; Tungsten;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2006. 5th IEEE Conference on
  • Conference_Location
    Daegu
  • ISSN
    1930-0395
  • Print_ISBN
    1-4244-0375-8
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2007.355600
  • Filename
    4178752