DocumentCode :
2496340
Title :
On-Line Directional Algebraic Reconstruction Technique for Electrical Capacitance Tomography
Author :
Kim, Ji-Hoon ; Kang, Byoung-Chae ; Choi, Bong-Yeol ; Lee, Seong-Hun ; Kim, Kyung-Youn
Author_Institution :
Kyungpook Nat. Univ., Daegu
fYear :
2006
fDate :
22-25 Oct. 2006
Firstpage :
923
Lastpage :
926
Abstract :
In general, image reconstruction algorithms for electrical capacitance tomography (ECT) can be classified into iterative and noniterative algorithms. Iterative algorithms produce better quality images however they can only be used off-line due to intensive computational burden. In the context of computational burden, in this paper we propose a fast noniterative image reconstruction algorithm called on-line directional algebraic reconstruction technique (OLDART) which like its predecessor, directional algebraic reconstruction technique (DART), produces the same quality image but reduces the reconstruction time. The reconstruction procedure of the proposed algorithm comprises of two steps. In the first step, a modified weighting matrix is generated off-line, and in the second step, the matrix is used for on-line image reconstruction in the same manner as the sensitivity matrix in the linear back-projection algorithm is used. In order to assess the reconstruction performance, extensive simulation results are provided for the proposed approach.
Keywords :
capacitance measurement; image reconstruction; iterative methods; matrix algebra; tomography; electrical capacitance tomography; image reconstruction algorithms; iterative algorithms; linear back-projection algorithm; modified weighting matrix; noniterative algorithms; online directional algebraic reconstruction technique; sensitivity matrix; Capacitance measurement; Capacitive sensors; Dielectric materials; Dielectric measurements; Electrical capacitance tomography; Image quality; Image reconstruction; Image sensors; Iterative algorithms; Permittivity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2006. 5th IEEE Conference on
Conference_Location :
Daegu
ISSN :
1930-0395
Print_ISBN :
1-4244-0375-8
Electronic_ISBN :
1930-0395
Type :
conf
DOI :
10.1109/ICSENS.2007.355617
Filename :
4178769
Link To Document :
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