Low "g" Sensitivity Crystal Units and Their Testing

Author

Warner, A. ; Goldfrank, B. ; Meirs, M. ; Rosenfeld, M.

fYear

1979

fDate

1979

Firstpage

306

Lastpage

310

Keywords

Acceleration; Aging; Fabrication; Frequency; Manufacturing; Ovens; Temperature control; Temperature sensors; Testing; Thermal stresses;

fLanguage

English

Publisher

ieee

Conference_Titel

33rd Annual Symposium on Frequency Control. 1979

Type

DOI

10.1109/FREQ.1979.200333

Filename

1537273

Link To Document