• DocumentCode
    2496567
  • Title

    A new wideband modeling technique for spiral inductors

  • Author

    Chiou, Ming Hsiang ; Hsu, Klaus Y J

  • Author_Institution
    Dept. of Electr. Eng., National Tsing Hua Univ., Hsinchu, Taiwan
  • fYear
    2003
  • fDate
    17-18 Nov. 2003
  • Firstpage
    186
  • Lastpage
    191
  • Abstract
    This paper presents a new modeling technique to exactly describe the time-domain (TD) responses of microwave spiral inductors, which leads to wideband models. This new method is suitable for modeling the spiral inductors used in switching type microwave circuits such as LC tank voltage-controlled oscillator (VCO) or in filters. The technique was developed based on applying an ultra-short impulse signal with 30ps (pico-second) width to the device. Furthermore, a simplified layer peeling technique (LPT) and a hybrid equivalent circuit model were used in the modeling process. Experiments were conducted to reveal the feasibility of the technique. Results show that the generated models can be used to describe the TD response of spiral inductors with a time-scale down to pico-seconds order. That is, the proposed method is easy to establish good wideband (tens or even hundreds of GHz) spiral inductor models for describing their wideband characteristics.
  • Keywords
    inductors; microwave circuits; semiconductor device models; time-domain analysis; LC tank; LPT; VCO; filters; hybrid equivalent circuit model; layer peeling technique; microwave spiral inductors; switching type microwave circuits; time-domain responses; ultra-short impulse signal; voltage-controlled oscillator; wideband characteristics; wideband modeling; Inductors; Microwave circuits; Microwave devices; Microwave filters; Microwave theory and techniques; Spirals; Switching circuits; Time domain analysis; Voltage-controlled oscillators; Wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices for Microwave and Optoelectronic Applications, 2003. EDMO 2003. The 11th IEEE International Symposium on
  • Print_ISBN
    0-7803-7904-7
  • Type

    conf

  • DOI
    10.1109/EDMO.2003.1260039
  • Filename
    1260039