Title :
ATE features for Iddq testing
Author_Institution :
Credence Syst. Corp., Beaverton, OR, USA
Abstract :
This paper briefly reviews the value of Iddq testing and the challenges it presents traditional ATE hardware and software. It then describes several new hardware and software innovations to support Iddq testing and other Idd measurements which have been incorporated into a commercial ATE system
Keywords :
CMOS digital integrated circuits; automatic test equipment; automatic test software; electric current measurement; integrated circuit testing; leakage currents; ATE hardware; ATE software; Iddq testing; commercial ATE system; complex CMOS devices; fault coverage; gate-oxide shorts; low current measurement capability; vector-triggered device power supply; Circuit faults; Circuit testing; Current measurement; Decision support systems; Fiber reinforced plastics; Instruments; Power measurement; Production; Software testing; Switches; System testing; Testing; Time measurement; Virtual reality;
Conference_Titel :
Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian
Print_ISBN :
0-8186-8277-9
DOI :
10.1109/ATS.1998.741607
