DocumentCode :
2496640
Title :
Automatic cell tracking applied to analysis of cell migration in wound healing assay
Author :
Bise, Ryoma ; Kanade, Takeo ; Yin, Zhaozheng ; Huh, Seung-il
Author_Institution :
Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear :
2011
fDate :
Aug. 30 2011-Sept. 3 2011
Firstpage :
6174
Lastpage :
6179
Abstract :
The wound healing assay in vitro is widely used for research and discovery in biology and medicine. This assay allows for observing the healing process in vitro in which the cells on the edges of the artificial wound migrate toward the wound area. The influence of different culture conditions can be measured by observing the change in the size of the wound area. For further investigation, more detailed measurements of the cell behaviors are required. In this paper, we present an application of automatic cell tracking in phase-contrast microscopy images to wound healing assay. The cell behaviors under three different culture conditions have been analyzed. Our cell tracking system can track individual cells during the healing process and provide detailed spatio-temporal measurements of cell behaviors. The application demonstrates the effectiveness of automatic cell tracking for quantitative and detailed analysis of the cell behaviors in wound healing assay in vitro.
Keywords :
biomedical optical imaging; cellular biophysics; optical microscopy; wounds; automatic cell tracking; cell migration; phase-contrast microscopy; wound healing assay; Algorithm design and analysis; Biology; Biomedical imaging; In vitro; Microscopy; Tracking; Wounds; Algorithms; Animals; Automation; Bicyclo Compounds, Heterocyclic; Cell Culture Techniques; Cell Line, Tumor; Cell Movement; Cell Tracking; Cells, Cultured; Culture Media; Equipment Design; Humans; Imaging, Three-Dimensional; Microscopy; Microscopy, Phase-Contrast; Mitosis; Neoplasms; Thiazolidines; Time Factors; Wound Healing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location :
Boston, MA
ISSN :
1557-170X
Print_ISBN :
978-1-4244-4121-1
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/IEMBS.2011.6091525
Filename :
6091525
Link To Document :
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