Title :
Image denoising via nonlocal means with noise-robust similarity
Author :
Kawata, Shigeo ; Taguchi, Yasuhiro ; Matsumoto, Naoyuki ; Isogawa, K. ; Kaneko, Tetsuya
Author_Institution :
Corp. R&DCenter, Toshiba Corp., Kawasaki, Japan
Abstract :
We propose an effective image denoising method by revising the conventional “nonlocal means (NL-means)” method. Conventional NL-means replaces a noisy pixel by the weighted average of other reference pixels depending on the similarity between local neighborhoods of target pixel and reference pixels. Noise, however, reduces the similarity even within the same pattern blocks. This is due to the weighted average of dissimilar blocks of pixels, which makes the result image blurred or irregular. Hence, our proposal is to calculate the similarity with the combination of basis patterns correlated statistically with little noise through principal component analysis making use of local structures that have low correlation with incurred noise. The first step is to exclude the local structures of the given image whose statistical correlation with the original images is slight. The second step is to exclude basis patterns whose correlation with the target blocks is slight. Making use of the selected basis patterns, we can calculate the similarity robust to any noise. Consequently, high-quality images can be obtained. Comparing with other methods, our experiments show our method denoises effectively without causing any blur or irregularity.
Keywords :
correlation methods; image denoising; image restoration; principal component analysis; statistical analysis; NL-means method; dissimilar pixel block; image blurring; image denoising method; image irregular; incurred noise correlation; noise-robust similarity; nonlocal means method; principal component analysis; reference pixel; statistical correlation; target pixel; Correlation; Image denoising; Noise; Noise robustness; Principal component analysis; Vectors; Noise reduction; Non local means; Principal component analysis;
Conference_Titel :
Consumer Electronics (GCCE), 2012 IEEE 1st Global Conference on
Conference_Location :
Tokyo
Print_ISBN :
978-1-4673-1500-5
DOI :
10.1109/GCCE.2012.6379604