Title :
Leadership Microprocessors: Validation, debug and test
Author :
Shenoy, Sunil R.
Author_Institution :
Intel, USA
Abstract :
I will discuss the use of high level design and abstraction for modeling, simulation and validation of leadership microprocessors, the challenges we have faced in this domain, our learnings and our vision and strategy for the future.
Keywords :
Computer architecture; Face detection; Graphics; Microprocessors; Mobile computing; Testing; Workstations;
Conference_Titel :
High Level Design Validation and Test Workshop, 2009. HLDVT 2009. IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
978-1-4244-4823-4
Electronic_ISBN :
1552-6674
DOI :
10.1109/HLDVT.2009.5340187
