DocumentCode
2496964
Title
Statistical characterization and segmentation of drusen in fundus images
Author
Santos-Villalobos, H. ; Karnowski, T.P. ; Aykac, D. ; Giancardo, L. ; Li, Y. ; Nichols, T. ; Tobin, K.W., Jr. ; Chaum, E.
Author_Institution
Oak Ridge Nat. Lab., Oak Ridge, TN, USA
fYear
2011
fDate
Aug. 30 2011-Sept. 3 2011
Firstpage
6236
Lastpage
6241
Abstract
Age related Macular Degeneration (AMD) is a disease of the retina associated with aging. AMD progression in patients is characterized by drusen, pigmentation changes, and geographic atrophy, which can be seen using fundus imagery. The level of AMD is characterized by standard scaling methods, which can be somewhat subjective in practice. In this work we propose a statistical image processing approach to segment drusen with the ultimate goal of characterizing the AMD progression in a data set of longitudinal images. The method characterizes retinal structures with a statistical model of the colors in the retina image. When comparing the segmentation results of the method between longitudinal images with known AMD progression and those without, the method detects progression in our longitudinal data set with an area under the receiver operating characteristics curve of 0.99.
Keywords
biomedical optical imaging; diseases; eye; image segmentation; medical image processing; statistical analysis; AMD progression; age related macular degeneration; disease; drusen; fundus images; geographic atrophy; image segmentation; pigmentation; statistical characterization; Biomedical imaging; Blood vessels; Diseases; Image color analysis; Image segmentation; Lesions; Retina; Algorithms; Atrophy; Colorimetry; Databases, Factual; Disease Progression; Fundus Oculi; Humans; Image Processing, Computer-Assisted; Macular Degeneration; Models, Statistical; Neural Networks (Computer); Normal Distribution; Pigmentation; ROC Curve; Retina; Retinal Drusen;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location
Boston, MA
ISSN
1557-170X
Print_ISBN
978-1-4244-4121-1
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2011.6091540
Filename
6091540
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