Title :
Built-in self-test for multiple CLB faults of a LUT type FPGA
Author :
Itazaki, Noriyoshi ; Matsuki, Fumiro ; Matsumoto, Yasuyuki ; Kinoshita, Kozo
Author_Institution :
Dept. of Appl. Phys., Osaka Univ., Japan
Abstract :
A new Built-in Self Test (BIST) method for multiple configurable logic block (CLB) faults of SRAM-Look-Up-Table (LUT) type FPGA is reported. In this method, self test is performed concurrently for every test block containing eight CLBs. Faulty FPGA which includes up to five faulty CLBs in one test block can be detected completely even if each faulted CLB includes unlimited number of faults
Keywords :
built-in self test; fault location; field programmable gate arrays; integrated circuit testing; logic testing; table lookup; BIST method; LUT type FPGA; SRAM-look-up-table type; built-in self-test; configurable logic block faults; multiple CLB faults; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Field programmable gate arrays; Logic devices; Logic testing; Performance evaluation; Table lookup; Test pattern generators;
Conference_Titel :
Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian
Print_ISBN :
0-8186-8277-9
DOI :
10.1109/ATS.1998.741624
