• DocumentCode
    2497203
  • Title

    Highly abrupt modulation Zn doping in LP-MOVPE grown InAlAs as applied to quantum well electron transfer structures for optical switching

  • Author

    Reier, F.W. ; Agrawal, N. ; Harde, P. ; Bochnia, R.

  • Author_Institution
    Heinrich-Hertz-Inst. fuer Nachrichtentechnik Berlin GmbH, Germany
  • fYear
    1993
  • fDate
    19-22 Apr 1993
  • Firstpage
    703
  • Lastpage
    706
  • Abstract
    Acceptor incorporation with sharp doping interfaces is required for a variety of long wavelength optoelectronic devices. However, relatively strong diffusion effects are observed in the InGaAsP materials especially as the alloy bandgap increases. To overcome this difficulty, the Zn acceptor doping is studied for low pressure metal organic vapor phase epitaxial grown InAlAs lattice matched to InP for applications in electron transfer structures for optical switching. The optimized growth conditions for Zn doping including the effect of source materials are described in detail. Results which demonstrate highly abrupt modulation Zn doping obtained in multi quantum well structures are presented
  • Keywords
    III-V semiconductors; aluminium compounds; indium compounds; optical switches; optoelectronic devices; semiconductor doping; semiconductor growth; semiconductor quantum wells; vapour phase epitaxial growth; zinc; InP-InAlAs:Zn; LP-MOVPE grown; Zn doping; acceptor incorporation; bandgap; diffusion effects; highly abrupt modulator; lattice matched; long wavelength optoelectronic devices; multi quantum well structures; optical switching; optimized growth conditions; quantum well electron transfer structures; sharp doping interfaces; source materials; Doping; Electron optics; Indium compounds; Indium phosphide; Lattices; Optical materials; Optical modulation; Optoelectronic devices; Photonic band gap; Zinc;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1993. Conference Proceedings., Fifth International Conference on
  • Conference_Location
    Paris
  • Print_ISBN
    0-7803-0993-6
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1993.380547
  • Filename
    380547