Dynamic test set generation for analog circuits and systems

In this paper, we present an approach to construct a set of dynamic test signals for analog circuits and systems. Testability transfer factors are introduced and we use them as the basis to construct an efficient test set. Fault detectability and fault coverage are defined. Two circuits from the suite of analog and mixed-signal circuits are used to evaluate our approach. The fault coverage is 100% for both circuits studied. The approach presented may be used to construct inputs signals for the selection of an external stimulus applied through an arbitrary waveform generator