DC nonlinear circuit fault simulation with large change sensitivity

Author

Wong, Mike W T ; Worsman, Matthew

Author_Institution

Dept. of Electron. Eng., Hong Kong Polytech., Kowloon, Hong Kong

fYear

1998

fDate

2-4 Dec 1998

Firstpage

366

Lastpage

371

Abstract

Recently a method was proposed for using Large Change Sensitivity (LCS) for DC nonlinear circuit fault simulation. This allowed the advantages of LCS, namely computational efficiency and exactness of solution, to become available for nonlinear circuit Simulation-Before-Test fault diagnosis. This paper improves on that work by further reducing the computational effort in calculating the LCS of nonlinear circuit faults and generalising the algorithm to handle circuits of multiple nonlinear components. Faults are restricted to single catastrophic or parametric linear component faults

Keywords

analogue circuits; circuit simulation; fault diagnosis; fault simulation; nonlinear network analysis; piecewise linear techniques; DC nonlinear circuit fault simulation; analog fault diagnosis; computational efficiency; large change sensitivity; multiple nonlinear components; parametric linear component faults; single catastrophic faults; Analog circuits; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Costs; Dictionaries; Ear; Fault diagnosis; Nonlinear circuits; Nonlinear equations; Piecewise linear approximation; Vectors;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian

ISSN

1081-7735

Print_ISBN

0-8186-8277-9

Type

conf

DOI

10.1109/ATS.1998.741640

Filename

741640