Title :
DC nonlinear circuit fault simulation with large change sensitivity
Author :
Wong, Mike W T ; Worsman, Matthew
Author_Institution :
Dept. of Electron. Eng., Hong Kong Polytech., Kowloon, Hong Kong
Abstract :
Recently a method was proposed for using Large Change Sensitivity (LCS) for DC nonlinear circuit fault simulation. This allowed the advantages of LCS, namely computational efficiency and exactness of solution, to become available for nonlinear circuit Simulation-Before-Test fault diagnosis. This paper improves on that work by further reducing the computational effort in calculating the LCS of nonlinear circuit faults and generalising the algorithm to handle circuits of multiple nonlinear components. Faults are restricted to single catastrophic or parametric linear component faults
Keywords :
analogue circuits; circuit simulation; fault diagnosis; fault simulation; nonlinear network analysis; piecewise linear techniques; DC nonlinear circuit fault simulation; analog fault diagnosis; computational efficiency; large change sensitivity; multiple nonlinear components; parametric linear component faults; single catastrophic faults; Analog circuits; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Costs; Dictionaries; Ear; Fault diagnosis; Nonlinear circuits; Nonlinear equations; Piecewise linear approximation; Vectors;
Conference_Titel :
Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian
Print_ISBN :
0-8186-8277-9
DOI :
10.1109/ATS.1998.741640