Title :
Studies of Micron Order Defects in Quartz by a High Angular Resolved X-Ray Small Angle Scattering Technique
Author :
Suzuki, Carlos K. ; Iwasaki, Fumiko ; Kohra, Kazutake
Keywords :
Amorphous materials; Annealing; Crystals; Diffraction; Energy resolution; Laboratories; Power engineering and energy; Size measurement; Surfaces; X-ray scattering;
Conference_Titel :
34th Annual Symposium on Frequency Control. 1980
DOI :
10.1109/FREQ.1980.200379
