DocumentCode :
2497453
Title :
System tests for devices implementing IEEE 1588–2008
Author :
Schultheis, Michael ; Wheelwright, Lynn
Author_Institution :
Rohde & Schwarz GmbH & Co. KG, Munich, Germany
fYear :
2009
fDate :
12-16 Oct. 2009
Firstpage :
1
Lastpage :
4
Abstract :
The IEEE 1588 Standard, sometimes called PTP, specifies that PTP nodes conform to all clauses of the standard with the exception of ldquooptionalrdquo clauses and that applications that distribute only frequency do not require the measurement of the path delays (section 19.2.1, [1]). The standard doesn´t provide specifications for conformance testing. Conformance testing requires the consideration of PTP functionality, specific test configurations, test sequences, and the interpretation and recording of test results. This paper discusses a system test suite that offers a wide range of test sequences covering the most common protocol functions of a PTP node. One of the most difficult of these tests that ensures that a clock ignores irrelevant messages or message fields is explored in detail. Based on early testing experience a list of the most common implementation errors are presented.
Keywords :
IEEE standards; conformance testing; protocols; synchronisation; timing; IEEE 1588-2008; conformance testing; precision timing protocol; system test; test configurations; test sequences; Clocks; Communication standards; Delay; Frequency measurement; Frequency synchronization; Instruments; Measurement standards; Protocols; Switches; System testing; IEEE 1588; LXI; PTP; conformance tests;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Clock Synchronization for Measurement, Control and Communication, 2009. ISPCS 2009. International Symposium on
Conference_Location :
Brescia
Print_ISBN :
978-1-4244-4391-8
Electronic_ISBN :
978-1-4244-4392-5
Type :
conf
DOI :
10.1109/ISPCS.2009.5340220
Filename :
5340220
Link To Document :
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