DocumentCode
2497453
Title
System tests for devices implementing IEEE 1588–2008
Author
Schultheis, Michael ; Wheelwright, Lynn
Author_Institution
Rohde & Schwarz GmbH & Co. KG, Munich, Germany
fYear
2009
fDate
12-16 Oct. 2009
Firstpage
1
Lastpage
4
Abstract
The IEEE 1588 Standard, sometimes called PTP, specifies that PTP nodes conform to all clauses of the standard with the exception of ldquooptionalrdquo clauses and that applications that distribute only frequency do not require the measurement of the path delays (section 19.2.1, [1]). The standard doesn´t provide specifications for conformance testing. Conformance testing requires the consideration of PTP functionality, specific test configurations, test sequences, and the interpretation and recording of test results. This paper discusses a system test suite that offers a wide range of test sequences covering the most common protocol functions of a PTP node. One of the most difficult of these tests that ensures that a clock ignores irrelevant messages or message fields is explored in detail. Based on early testing experience a list of the most common implementation errors are presented.
Keywords
IEEE standards; conformance testing; protocols; synchronisation; timing; IEEE 1588-2008; conformance testing; precision timing protocol; system test; test configurations; test sequences; Clocks; Communication standards; Delay; Frequency measurement; Frequency synchronization; Instruments; Measurement standards; Protocols; Switches; System testing; IEEE 1588; LXI; PTP; conformance tests;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Clock Synchronization for Measurement, Control and Communication, 2009. ISPCS 2009. International Symposium on
Conference_Location
Brescia
Print_ISBN
978-1-4244-4391-8
Electronic_ISBN
978-1-4244-4392-5
Type
conf
DOI
10.1109/ISPCS.2009.5340220
Filename
5340220
Link To Document