DocumentCode :
2497486
Title :
Reflectivity analysis of the Bragg reflector based on periodic structures of different thin layers
Author :
Purica, Munizer ; Budianu, E. ; Kusko, M. ; Dragoman, D.
Author_Institution :
Nat. Inst. for R&D in Microtechnologies, Bucharest, Romania
fYear :
2003
fDate :
17-18 Nov. 2003
Firstpage :
296
Lastpage :
301
Abstract :
An analytical model for calculating the reflection and transmission coefficients of a Bragg reflector with periodic structure is derived. Using explicit expressions for these coefficients the reflectivity of the periodic structures for different pairs of layers and layer thickness was simulated. We investigate the reflectivity of the periodic structures consisting of following pairs of successive layers: SiO2/Si3N4 (low ratio of refractive indexest); poly-Si/SiO2(high ratio), Si/air gap (high contrast). The theoretical and experimental investigations of a particular periodic structure consisting of SiO2/Au are also presented. Our method allows the rapid evaluation of reflectance of Bragg reflector with periodic structure.
Keywords :
distributed Bragg reflectors; gold; microwave photonics; periodic structures; reflectivity; silicon compounds; Bragg reflector; SiO2-Au; SiO2-Si3N4; periodic structures; reflection coefficients; reflectivity analysis; thin layers; transmission coefficients; Analytical models; Dielectrics; Gold; Magnetic analysis; Optical filters; Optical reflection; Periodic structures; Photodetectors; Reflectivity; Tellurium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices for Microwave and Optoelectronic Applications, 2003. EDMO 2003. The 11th IEEE International Symposium on
Print_ISBN :
0-7803-7904-7
Type :
conf
DOI :
10.1109/EDMO.2003.1260089
Filename :
1260089
Link To Document :
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