Title :
Comparative analysis of delay for sub-threshold CMOS logics
Author :
Jain, Sonal ; Chanda, Manash ; Sarkar, Chandan K.
Author_Institution :
Dept. of Electron. & Commun. Eng., Meghnad Saha Inst. of Technol., Kolkata, India
Abstract :
In this paper, the propagation delays of various MOSFET structures in the sub-threshold regime is calculated for a 22nm MOSFET and a comparative analysis of the delays is presented. The sensitivity of the propagation delay to supply voltage and temperature is also put forward in this paper. The EKV model of MOSFET is used to describe the sub-threshold conduction current, taking into account the body-drain, body-source potential dependencies.
Keywords :
CMOS logic circuits; delays; EKV model; MOSFET structure; body-drain potential dependency; body-source potential dependency; comparative analysis; delay analysis; propagation delay; size 22 nm; subthreshold CMOS logic; subthreshold regime; supply voltage; CMOS integrated circuits; Delays; Integrated circuit modeling; MOSFET; Propagation delay; Sensitivity; DTMOS; delay; invertor; sensitivity; sub-threshold;
Conference_Titel :
Engineering and Systems (SCES), 2013 Students Conference on
Conference_Location :
Allahabad
Print_ISBN :
978-1-4673-5628-2
DOI :
10.1109/SCES.2013.6547500